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E-raamat: Semiconductor Devices in Harsh Conditions

Edited by (Leibniz University Hannover, Germany), Edited by (Portland State University, Oregon, USA)
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Editors Weide-Zaage and Chrzanowska-Jeske present readers with a collection of research papers and scholarly articles investigating current and emerging application for semiconductor devices in an array of harsh conditions on earth and beyond. The editors have organized the ten selections that make up the main body of the text in three parts devoted to radiation, sensors and operating conditions, and packaging and system design. Kristin Weide-Azzge is a faculty member of the Gottfried Wilhelm Leibniz University in Hannover, Germany. Malgorzata Chrzanowska-Jeske is a faculty member of Portland State University in Oregon. Annotation ©2017 Ringgold, Inc., Portland, OR (protoview.com)

The book focuses on radiation, operating conditions, sensor systems, and package and system design. It is divided into three parts: The first part deals with sensing devices designed for operating in the presence of radiation, commercials of the shelf (COTS) products for space computing, and influences of single event upset. Part two covers system and package design for harsh operating conditions, and part three presents devices for biomedical applications under moisture and temperature loads in the frame of sensor systems and operating conditions.

Arvustused

"Engineers are developing electronic systems for applications in environments significantly more taxing than those seen in classical computing applications. This book exposes engineers to the range of challenges faced and fosters an understanding of the approaches useful to succeed in those taxing application environments. It has an outstanding overview of the challenges to design electronic systems to operate in the presence of hazards in extreme environments."

Klaus Schuegraf, Cymer, San Diego, California, USA

Foreword xi
Preface xiii
Editors xix
Contributors xxi
Section I Radiation
1 Commercial Off-the-Shelf Components in Space Applications
3(18)
Stefano Esposito
Massimo Violante
2 Soft Errors in Digital Circuits Subjected to Natural Radiation: Characterisation, Modelling and Simulation Issues
21(22)
Daniela Munteanu
Jean-Luc Autran
3 Simulation of Single-Event Effects on Fully Depleted Silicon-on-Insulator (FDSOI) CMOS
43(26)
Walter Calienes Bartra
Andreas Vladimirescu
Ricardo Reis
Section II Sensors and Operating Conditions
4 Electronic Sensors for the Detection of Ovarian Cancer
69(18)
A. M. Whited
Raj Solanki
5 Sensors and Sensor Systems for Harsh Environment Applications
87(24)
Andrea De Luca
Florin Udrea
Guoli Li
Yun Zeng
Nicolas Andre
Guillaume Pollissard-Quatremere
Laurent A. Francis
Denis Flandre
Zoltan Racz
Julian W. Gardner
Syed Zeeshan Ali
Octavian Buiu
Bogdan C. Serban
Cornel Cobianu
Tracy Wotherspoon
6 III-Nitride Electronic Devices for Harsh Environments
111(24)
Shyh-Chiang Shen
Section III Packaging and System Design
7 Packaging for Systems in Harsh Environments
135(14)
Marc Christopher Wurz
Sebastian Bengsch
8 Corrosion Resistance of Lead-Free Solders under Environmental Stress
149(18)
Suhana Mohd Said
Nor Ilyana Muhd Nordin
9 From Deep Submicron Degradation Effects to Harsh Operating Environments: A Self-Healing Calibration Methodology for Performance and Reliability Enhancement
167(30)
Eric J. Wyers
Paul D. Franzon
10 Role of Diffusional Interfacial Sliding during Temperature Cycling and Electromigration-Induced Motion of Copper Through Silicon Via
197(28)
Lutz Meinshausen
Ming Liu
Indranath Dutta
Tae-Kyu Lee
Li Li
Index 225
Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske