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E-raamat: Spectroscopy of Semiconductors

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Spectroscopic techniques are among the most powerful characterization methods used to study semiconductors. This volume presents reviews of a number of major spectroscopic techniques used to investigate bulk and artificially structured semiconductors including: photoluminescence, photo-reflectance, inelastic light scattering, magneto-optics, ultrafast work, piezo-spectroscopy methods, and spectroscopy at extremely low temperatures and high magnetic fields. Emphasis is given to major semiconductor systems, and artificially structured materials such as GaAs, InSb, Hg1-xCdxTe and MBE grown structures based upon GaAs/AlGaAs materials. Both the spectroscopic novice and the expert will benefit from the descriptions and discussions of the methods, principles, and applications relevant to today's semiconductor structures.

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Key Features * Discusses the latest advances in spectroscopic techniques used to investigate bulk and artificially structured semiconductors * Features detailed review articles which cover basic principles * Highlights specific applications such as the use of laser spectroscopy for the characterization of GaAs quantum well structures
Laser spectroscopy of semiconductors at low temperatures and high
magnetic fields, D. Heiman; transient spectroscopy by ultrashort laser pulse
techniques, A.V. Nurmikko; piezospectroscopy of semiconductors, A.K. Ramdas
and S. Rodriguez; photoreflectance spectroscpoy of microstructures, O.J.
Glembocki and B.V. Shanabrook; one- and two-photon magneto-optical
spectroscopy of InSb and Hg(1-x)Cd(x)Te, D.G. Seiler, et al.