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E-raamat: Timing Analysis and Simulation for Signal Integrity Engineers

  • Formaat: EPUB+DRM
  • Ilmumisaeg: 22-Oct-2007
  • Kirjastus: Prentice Hall
  • Keel: eng
  • ISBN-13: 9780132797184
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  • Formaat: EPUB+DRM
  • Ilmumisaeg: 22-Oct-2007
  • Kirjastus: Prentice Hall
  • Keel: eng
  • ISBN-13: 9780132797184
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Every day, companies call upon their signal integrity engineers to make difficult decisions about design constraints and timing margins.Can I move these wires closer together? How many holes can I drill in this net? How far apart can I place these chips? Each design is unique: there’s no single recipe that answers all the questions. Today’s designs require ever greater precision, but design guides for specific digital interfaces are by nature conservative. Now, for the first time, there’s a complete guide to timing analysis and simulation that will help you manage the tradeoffs between signal integrity, performance, and cost.

Writing from the perspective of a practicing SI engineer and team lead, Greg Edlund of IBM presents deep knowledge and quantitative techniques for making better decisions about digital interface design. Edlund shares his insights into how and why digital interfaces fail, revealing how fundamental sources of pathological effects can combine to create fault conditions. You won’t just learn Edlund’s expert techniques for avoiding failures: you’ll learn how to develop the right approach foryour own projects and environment.

Coverage includes

• Systematically ensure that interfaces will operate with positive timing margin over the product’s lifetime–without incurring excess cost

• Understand essential chip-to-chip timing concepts in the context of signal integrity

• Collect the right information upfront, so you can analyze new designs more effectively

• Review the circuits that store information in CMOS state machines–and how they fail

• Learn how to time common-clock, source synchronous, and high-speed serial transfers

• Thoroughly understand how interconnect electrical characteristics affect timing: propagation delay, impedance profile, crosstalk, resonances, and frequency-dependent loss

• Model 3D discontinuities using electromagnetic field solvers

• Walk through four case studies: coupled differential vias, land grid array connector, DDR2 memory data transfer, and PCI Express channel

• Appendices present a refresher on SPICE modeling and a high-level conceptual framework for electromagnetic field behavior

Objective, realistic, and practical, this is the signal integrity resource engineers have been searching for.

Preface xiii

Acknowledgments xvi

About the Author xix

About the Cover xx

Chapter 1: Engineering Reliable Digital Interfaces 1

Chapter 2: Chip-to-Chip Timing 13

Chapter 3: Inside IO Circuits 39

Chapter 4: Modeling 3D Discontinuities 73

Chapter 5: Practical 3D Examples 101

Chapter 6: DDR2 Case Study 133

Chapter 7: PCI Express Case Study 175

Appendix A: A Short CMOS and SPICE Primer 209

Appendix B: A Stroll Through 3D Fields 219

Endnotes 233

Index 235

Muu info

Every day, companies call upon their signal integrity engineers to make difficult decisions about design constraints and timing margins. Can I move these wires closer together? How many holes can I drill in this net? How far apart can I place these chips? Each design is unique: theres no single recipe that answers all the questions. Todays designs require ever greater precision, but design guides for specific digital interfaces are by nature conservative. Now, for the first time, theres a complete guide to timing analysis and simulation that will help you manage the tradeoffs between signal integrity, performance, and cost.

 

Writing from the perspective of a practicing SI engineer and team lead, Greg Edlund of IBM presents deep knowledge and quantitative techniques for making better decisions about digital interface design. Edlund shares his insights into how and why digital interfaces fail, revealing how fundamental sources of pathological effects can combine to create fault conditions. You wont just learn Edlunds expert techniques for avoiding failures: youll learn how to develop the right approach for your own projects and environment.

 

Coverage includes

  Systematically ensure that interfaces will operate with positive timing margin over the products lifetimewithout incurring excess cost

  Understand essential chip-to-chip timing concepts in the context of signal integrity

  Collect the right information upfront, so you can analyze new designs more effectively

  Review the circuits that store information in CMOS state machinesand how they fail

  Learn how to time common-clock, source synchronous, and high-speed serial transfers

  Thoroughly understand how interconnect electrical characteristics affect timing: propagation delay, impedance profile, crosstalk, resonances, and frequency-dependent loss

  Model 3D discontinuities using electromagnetic field solvers

  Walk through four case studies: coupled differential vias, land grid array connector, DDR2 memory data transfer, and PCI Express channel

  Appendices present a refresher on SPICE modeling and a high-level conceptual framework for electromagnetic field behavior

Objective, realistic, and practical, this is the signal integrity resource engineers have been searching for.

 

Preface xiii

Acknowledgments xvi

About the Author xix

About the Cover xx

 

Chapter 1: Engineering Reliable Digital Interfaces 1

Chapter 2: Chip-to-Chip Timing 13

Chapter 3: Inside IO Circuits 39

Chapter 4: Modeling 3D Discontinuities 73

Chapter 5: Practical 3D Examples 101

Chapter 6: DDR2 Case Study 133

Chapter 7: PCI Express Case Study 175

 

Appendix A: A Short CMOS and SPICE Primer 209

Appendix B: A Stroll Through 3D Fields 219

 

Endnotes 233

Index 235

 
Preface xiii
Acknowledgments xvi
About the Author xix
About the Cover xx
Engineering Reliable Digital Interfaces
1(12)
A Sadly Familiar Tale
3(1)
Power On
4(2)
The Long Reach of Legacy Design
6(2)
Reflections on a Near Disaster
8(1)
Motivations to Develop a Simulation Strategy
9(1)
The Boundaries of Simulation Space
10(3)
Chip-to-Chip Timing
13(26)
Root Cause
14(1)
CMOS Latch
14(4)
Timing Failures
18(1)
Setup and Hold Constraints
19(3)
Common-Clock On-Chip Timing
22(3)
Setup and Hold SPICE Simulations
25(1)
Timing Budget
26(2)
Common-Clock IO Timing
28(4)
Common-Clock IO Timing Using a Standard Load
32(6)
Limits of the Common-Clock Architecture
38(1)
Inside IO Circuits
39(34)
CMOS Receiver
40(2)
CMOS Differential Receiver
42(1)
Pin Capacitance
43(2)
Receiver Current-Voltage Characteristics
45(1)
CMOS Push-Pull Driver
46(2)
Output Impedance
48(1)
Output Rise and Fall Times
49(2)
CMOS Current Mode Driver
51(2)
Behavioral Modeling of IO Circuits
53(1)
Behavioral Model for CMOS Push-Pull Driver
54(2)
Behavioral Modeling Assumptions
56(1)
Tour of an IBIS Model
56(5)
IBIS Header
61(1)
IBIS Pin Table
61(1)
IBIS Receiver Model
62(1)
IBIS Driver Model
63(2)
Behavioral Modeling Assumptions (Reprise)
65(1)
Comparison of SPICE and IBIS Models
66(2)
Accuracy and Quality of IO Circuit Models
68(5)
Modeling 3D Discontinuities
73(28)
Beyond Transmission Lines
74(1)
Finite Difference Time Domain Method
75(4)
Solo Flight in a 3D Field Solver
79(1)
Coaxial Transmission Line
80(2)
Boundary Conditions
82(1)
Waveguide Ports
83(1)
Stimulus Function
84(1)
Mesh Density
85(1)
Running the Solver
86(1)
Port Signals
87(1)
S-Parameters
88(1)
Energy
89(2)
Field Visualization
91(3)
Coaxial Discontinuity
94(2)
Formation of Reflection
96(1)
S-Parameters and Their Explanation
97(4)
Practical 3D Examples
101(32)
Coupled Differential Vias
102(1)
Mechanical Drawings
103(3)
Ports
106(2)
Mesh Density
108(5)
Sanity Check
113(1)
Documentation
114(2)
Pre-Flight Checklist
116(2)
Land Grid Array Connector
118(2)
Mechanical Trade-Offs
120(1)
Electrical Characterization
120(2)
3D Modeling Decisions
122(3)
Test Card Design
125(3)
Model-to-Hardware Correlation
128(5)
DDR2 Case Study
133(42)
Evolution from a Common Ancestor
134(3)
DDR2 Signaling
137(2)
Write Timing
139(2)
Read Timing
141(2)
Get to Know Your IO
143(1)
Off-Chip Driver
144(1)
On-Die Termination
145(2)
Rising and Falling Waveforms
147(1)
Interconnect Sensitivity Analysis
148(4)
Conductor and Dielectric Losses
152(2)
Impedance Tolerance
154(3)
Pin-to-Pin Capacitance Variation
157(1)
Length Variation Within a Byte Lane
158(1)
DIMM Connector Crosstalk
158(5)
Vref AC Noise and Resistor Tolerance
163(2)
Slope Derating Factor
165(1)
Final Read and Write Timing Budgets
165(4)
Sources of Conservatism
169(2)
Assumptions
171(4)
PCI Express Case Study
175(34)
High-Speed Serial Interfaces
176(3)
Sensitivity Analysis
179(2)
Ideal Driver and Lossy Transmission Line
181(2)
Differential Driver with De-Emphasis
183(4)
Card Impedance Tolerance
187(2)
3D Discontinuities
189(3)
Channel Step Response
192(2)
Crosstalk Pathology
194(2)
Crosstalk-Induced Jitter
196(5)
Channel Characteristics
201(1)
Sensitivity Analysis Results
202(3)
Model-to-Hardware Correlation
205(2)
Reflections
207(2)
A Short CMOS and SPICE Primer
209(10)
MOSFETs
210(1)
Two Basic CMOS Circuits
211(3)
SPICE
214(1)
Sample SPICE Input Deck
214(1)
SPICE Transistor Models
215(2)
SPICE Subcircuits
217(2)
A Stroll Through 3D Fields
219(14)
Four Poetic Equations
219(1)
Charges at Rest
220(1)
Steady-State Currents
221(2)
The Non-Intuitive Force
223(2)
Enter Time
225(1)
Waves
226(3)
Dropping a Few Dimensions
229(4)
Endnotes 233(2)
Index 235


Greg Edlunds career in signal integrity began in 1988 at Supercomputer Systems, Inc., where he simulated and measured timing characteristics of bipolar embedded RAMs used in the computers vector registers. Since then, he has participated in the development and testing of nine other high-performance computing platforms for Cray Research, Inc., Digital Equipment Corp., and IBM Corp. He has had the good fortune of learning from many talented engineers while focusing his attention on modeling, simulation, and measurement of IO circuits and interconnect components. A solid physical foundation and practical engineering experience combine to form a valuable perspective on optimizing performance, reliability, and cost.