Muutke küpsiste eelistusi

E-raamat: Transmission Electron Microscopy Sample Preparation: From Specimen to Micrograph

  • Formaat: EPUB+DRM
  • Ilmumisaeg: 10-Feb-2025
  • Kirjastus: Springer International Publishing AG
  • Keel: eng
  • ISBN-13: 9783031829673
  • Formaat - EPUB+DRM
  • Hind: 185,24 €*
  • * hind on lõplik, st. muud allahindlused enam ei rakendu
  • Lisa ostukorvi
  • Lisa soovinimekirja
  • See e-raamat on mõeldud ainult isiklikuks kasutamiseks. E-raamatuid ei saa tagastada.
  • Formaat: EPUB+DRM
  • Ilmumisaeg: 10-Feb-2025
  • Kirjastus: Springer International Publishing AG
  • Keel: eng
  • ISBN-13: 9783031829673

DRM piirangud

  • Kopeerimine (copy/paste):

    ei ole lubatud

  • Printimine:

    ei ole lubatud

  • Kasutamine:

    Digitaalõiguste kaitse (DRM)
    Kirjastus on väljastanud selle e-raamatu krüpteeritud kujul, mis tähendab, et selle lugemiseks peate installeerima spetsiaalse tarkvara. Samuti peate looma endale  Adobe ID Rohkem infot siin. E-raamatut saab lugeda 1 kasutaja ning alla laadida kuni 6'de seadmesse (kõik autoriseeritud sama Adobe ID-ga).

    Vajalik tarkvara
    Mobiilsetes seadmetes (telefon või tahvelarvuti) lugemiseks peate installeerima selle tasuta rakenduse: PocketBook Reader (iOS / Android)

    PC või Mac seadmes lugemiseks peate installima Adobe Digital Editionsi (Seeon tasuta rakendus spetsiaalselt e-raamatute lugemiseks. Seda ei tohi segamini ajada Adober Reader'iga, mis tõenäoliselt on juba teie arvutisse installeeritud )

    Seda e-raamatut ei saa lugeda Amazon Kindle's. 

This book is a thorough guide tailored for researchers, academics, and practitioners immersed in the intricate world of Transmission Electron Microscopy (TEM). It offers a seamless blend of theoretical understanding and practical insights, providing readers with the essential skills to navigate the complexities of TEM sample preparation for optimal imaging.





The book begins by introducing the basics of TEM operation, progressing to advanced modes, and dedicating significant attention to the nuances of sample preparation. Each chapter serves as a stepping stone, guiding readers from specimen selection to the acquisition of high-resolution micrographs. The motivation behind this book lies in addressing the practical challenges of TEM operation and sample preparation. The book bridges the gap between theory and application, offering a simplified yet scientific repository of dos and donts for achieving successful results in TEM sample preparation.





Within these pages, readers will explore various thinning techniques, delve into the preparation of nanomaterials and biological samples, and grasp the intricacies of cryo-TEM and in-situ TEM. Along with troubleshooting guidance to common pitfalls, the book also provides practical tips for overcoming challenges in the sample preparation process. The book also addresses the importance of properly prepared TEM samples, emphasizing the often-underestimated role they play in unlocking the full potential of TEM imaging. Real-world case studies showcase the impact of high-quality sample preparation across diverse research fields.





This book is not just an informative guide; it is a journey of transformation and enlightenment, empowering the reader with the confidence and expertise needed for precise sample preparation and quality imaging.
Introduction to Transmission Electron Microscopy (TEM).- Fundamentals of
TEM Sample preparation.- Techniques for thin specimen from bulk Samples.- TEM
Sample Preparation for Powder and Liquid formulations.- Sample Preparation
for Soft Matters (Non Biological) and Biological Samples.- Introduction to
cryo-TEM and related sample preparation.- In-situ TEM: Principle, Working,
Application and Challenges.- Sample Preparation for Quantitative Analysis
under TEM.- Correlative light and Electron Microscopy (CLEM) Sample
Preparation.- Ideal TEM Imaging, analysis and Troubleshooting Tricks.- Unique
case studies in TEM instrumentation, analysis and interpretation.
Dr. Rajender Singh currently serves as a scientific officer in the Electron Microscopy Section at the Department of CIL/SAIF, Panjab University, Chandigarh, India. With nearly 13 years of experience in the field of electron microscopy, Dr. Singh is a seasoned expert in many facets of TEM sample preparation. His role involves analyzing diverse samples from material science and life science areas across India, utilizing cutting-edge instruments such as TEM (H7500, 120KV), HRTEM with SAED, EDS (Oxford), and FESEM with EDS (Hitachi SU8010). Dr. Singh is not only responsible for the operation of sophisticated instruments but also leads training modules for students at various academic levels, focusing on TEM, HRTEM, SEM, FESEM, ultramicrotome, and Critical Point Dryer (CPD) instruments.





His technical skills span handling HRTEM JEOL 2100 Plus independently, performing maintenance for various TEM models, and interpreting STEM bright field and dark field imaging.