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E-raamat: Wideband Microwave Materials Characterization

  • Formaat: 330 pages
  • Ilmumisaeg: 31-Jan-2023
  • Kirjastus: Artech House Publishers
  • ISBN-13: 9781630819477
  • Formaat - PDF+DRM
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  • Formaat: 330 pages
  • Ilmumisaeg: 31-Jan-2023
  • Kirjastus: Artech House Publishers
  • ISBN-13: 9781630819477

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This book is a practical engineering guide to microwave material measurements for both laboratory and manufacturing/field environments, including nondestructive inspection (NDI) and nondestructive evaluation (NDE). The book covers proven methods for characterizing materials at microwave frequencies, including both resonant and wide-bandwidth techniques, and gives you the necessary theory and equations for implementing these methods. Youll understand how to invert dielectric and/or magnetic material properties from free space transmission and reflection, and how to measure traveling wave attenuation. Youll also know how to measure dielectric and/or magnetic material properties from transmission line fixtures, and learn how to use computational electromagnetic modeling with a measurement fixture. The book shows you how to build and use microwave NDE equipment for radomes and/or structural dielectric materials. This is an excellent resource for Engineers/scientists conducting or analyzing RF/Microwave/MMW material measurements for applications in electromagnetic materials, as well as those who are developing or applying microwave non-destructive evaluation (NDE) methods to their manufacturing problems.
Preface xiii
1 Introduction to Electromagnetic Materials Properties
1(24)
1.1 Dielectric Properties
1(4)
1.2 Magnetic Properties
5(4)
1.3 Dispersion
9(6)
1.4 Anisotropy
15(2)
1.5 Engineered Materials
17(8)
References
23(2)
2 Free-Space Methods
25(44)
2.1 Historical Perspective
25(6)
2.2 Calibration
31(4)
2.2.1 One-Parameter Calibration
31(2)
2.2.2 Four-Parameter Calibration
33(2)
2.3 Time-Domain Processing
35(3)
2.4 Inverting Intrinsic Properties
38(15)
2.4.1 Microwave Network Analysis
38(4)
2.4.2 Nicolson-Ross-Weir Algorithm
42(2)
2.4.3 Iterative Algorithm: S11 or 521
44(3)
2.4.4 Iterative Algorithm: S11 and S21
47(1)
2.4.5 Iterative Algorithm: Shorted S11
48(1)
2.4.6 Iterative Algorithm: Shorted S11 and S21
49(1)
2.4.7 Iterative Algorithm: Four-Parameter
50(1)
2.4.8 Inverting Sheet Impedance
51(2)
2.5 Advanced Material Inversions
53(7)
2.5.1 N-Layer Inversion
53(2)
2.5.2 Two-Thickness Inversion
55(1)
2.5.3 Model-Based Inversion
56(4)
2.6 Absorber Characterization
60(9)
References
65(4)
3 Microwave Nondestructive Evaluation
69(34)
3.1 Sensors/Antennas
69(6)
3.2 Dealing with RF Cables
75(8)
3.3 Thickness Inversions
83(6)
3.4 Thickness and Property Inversion
89(3)
3.5 Defect Detection
92(11)
References
100(3)
4 Focused-Beam Methods
103(56)
4.1 Focused-Beam System Design
103(17)
4.1.1 Gaussian Beam Basics
105(3)
4.1.2 Lens Design
108(4)
4.1.3 ABCD Matrix Design
112(6)
4.1.4 Lens System Construction
118(2)
4.2 Focused-Beam Measurement Examples
120(11)
4.2.1 Dielectric Measurements
120(6)
4.2.2 Magneto-Dielectric Measurements
126(5)
4.3 Measurement Uncertainties
131(18)
4.3.1 Transmission Line Errors
132(3)
4.3.2 Focusing Error
135(5)
4.3.3 Beam-Shift Error
140(2)
4.3.4 Specimen Position
142(1)
4.3.5 Other Errors: Network Analyzer and Specimen
143(6)
4.4 Apertures
149(10)
References
156(3)
5 Transmission Line Methods
159(38)
5.1 Waveguides
159(15)
5.1.1 Waveguide Calibration
162(2)
5.1.2 Waveguide Property Inversion
164(2)
5.1.3 Waveguide Air-Gap Correction
166(8)
5.2 Coaxial Air Lines
174(14)
5.2.1 Coaxial Calibration and Material Inversion
175(5)
5.2.2 Air Gap Corrections in Coaxial Airlines
180(4)
5.2.3 Wrapped-Coaxial Airline Method
184(2)
5.2.4 Square Coaxial Airline
186(2)
5.3 Stripline Methods
188(3)
5.4 Other Transmission Line Methods
191(6)
References
192(5)
6 Scatter and Surface Waves
197(42)
6.1 Diffuse Scatter
197(23)
6.1.1 RCS
200(2)
6.1.2 Scattering Coefficient Measurement
202(5)
6.1.3 Examples of Scattering-Coefficient Measurement
207(4)
6.1.4 Echo-Width Measurement
211(2)
6.1.5 Examples of Echo-Width Measurement
213(2)
6.1.6 Cross-Polarized Scatter
215(5)
6.2 Near-Field Probe Measurements
220(6)
6.3 Surface-Traveling Wave
226(13)
6.3.1 Surface-Wave Attenuation
227(2)
6.3.2 Surface-Wave Attenuation Measurement
229(5)
6.3.3 Surface-Wave Backscatter
234(2)
References
236(3)
7 CEM-Based Methods
239(32)
7.1 CEM
239(3)
7.2 CEM Inversion of Broadband Materials
242(2)
7.3 CEM Inversion Example: RF Capacitor
244(13)
7.3.1 RF Capacitor Design
246(4)
7.3.2 RF Capacitor Uncertainty
250(2)
7.3.3 Example Measurements
252(5)
7.4 CEM-Inversion Example: Nondestructive Measurement Probes
257(7)
7.4.1 Epsilon Measurement Probe
258(3)
7.4.2 Mu Measurement Probe
261(3)
7.5 CEM Inversion Example: Slotted Rectangular Coaxial Line
264(7)
References
269(2)
8 Impedance Analysis and Related Methods
271(34)
8.1 Impedance Analysis
271(1)
8.2 Dielectric Spectroscopy
271(13)
8.2.1 Dielectric Parameters
274(3)
8.2.2 Electrode Fixtures
277(2)
8.2.3 Error Sources
279(5)
8.3 Dielectric Spectroscopy Applications
284(10)
8.3.1 Polymer Physics
286(4)
8.3.2 Cure and Process Monitoring
290(2)
8.3.3 Film Formation and Environmental Effects
292(1)
8.3.4 High-Frequency Dielectric Analyses
293(1)
8.4 Permeameter Methods
294(11)
References
300(5)
About the Author 305(2)
Index 307