Preface |
|
xiii | |
|
1 Introduction to Electromagnetic Materials Properties |
|
|
1 | (24) |
|
1.1 Dielectric Properties |
|
|
1 | (4) |
|
|
5 | (4) |
|
|
9 | (6) |
|
|
15 | (2) |
|
|
17 | (8) |
|
|
23 | (2) |
|
|
25 | (44) |
|
2.1 Historical Perspective |
|
|
25 | (6) |
|
|
31 | (4) |
|
2.2.1 One-Parameter Calibration |
|
|
31 | (2) |
|
2.2.2 Four-Parameter Calibration |
|
|
33 | (2) |
|
2.3 Time-Domain Processing |
|
|
35 | (3) |
|
2.4 Inverting Intrinsic Properties |
|
|
38 | (15) |
|
2.4.1 Microwave Network Analysis |
|
|
38 | (4) |
|
2.4.2 Nicolson-Ross-Weir Algorithm |
|
|
42 | (2) |
|
2.4.3 Iterative Algorithm: S11 or 521 |
|
|
44 | (3) |
|
2.4.4 Iterative Algorithm: S11 and S21 |
|
|
47 | (1) |
|
2.4.5 Iterative Algorithm: Shorted S11 |
|
|
48 | (1) |
|
2.4.6 Iterative Algorithm: Shorted S11 and S21 |
|
|
49 | (1) |
|
2.4.7 Iterative Algorithm: Four-Parameter |
|
|
50 | (1) |
|
2.4.8 Inverting Sheet Impedance |
|
|
51 | (2) |
|
2.5 Advanced Material Inversions |
|
|
53 | (7) |
|
|
53 | (2) |
|
2.5.2 Two-Thickness Inversion |
|
|
55 | (1) |
|
2.5.3 Model-Based Inversion |
|
|
56 | (4) |
|
2.6 Absorber Characterization |
|
|
60 | (9) |
|
|
65 | (4) |
|
3 Microwave Nondestructive Evaluation |
|
|
69 | (34) |
|
|
69 | (6) |
|
3.2 Dealing with RF Cables |
|
|
75 | (8) |
|
|
83 | (6) |
|
3.4 Thickness and Property Inversion |
|
|
89 | (3) |
|
|
92 | (11) |
|
|
100 | (3) |
|
|
103 | (56) |
|
4.1 Focused-Beam System Design |
|
|
103 | (17) |
|
4.1.1 Gaussian Beam Basics |
|
|
105 | (3) |
|
|
108 | (4) |
|
|
112 | (6) |
|
4.1.4 Lens System Construction |
|
|
118 | (2) |
|
4.2 Focused-Beam Measurement Examples |
|
|
120 | (11) |
|
4.2.1 Dielectric Measurements |
|
|
120 | (6) |
|
4.2.2 Magneto-Dielectric Measurements |
|
|
126 | (5) |
|
4.3 Measurement Uncertainties |
|
|
131 | (18) |
|
4.3.1 Transmission Line Errors |
|
|
132 | (3) |
|
|
135 | (5) |
|
|
140 | (2) |
|
|
142 | (1) |
|
4.3.5 Other Errors: Network Analyzer and Specimen |
|
|
143 | (6) |
|
|
149 | (10) |
|
|
156 | (3) |
|
5 Transmission Line Methods |
|
|
159 | (38) |
|
|
159 | (15) |
|
5.1.1 Waveguide Calibration |
|
|
162 | (2) |
|
5.1.2 Waveguide Property Inversion |
|
|
164 | (2) |
|
5.1.3 Waveguide Air-Gap Correction |
|
|
166 | (8) |
|
|
174 | (14) |
|
5.2.1 Coaxial Calibration and Material Inversion |
|
|
175 | (5) |
|
5.2.2 Air Gap Corrections in Coaxial Airlines |
|
|
180 | (4) |
|
5.2.3 Wrapped-Coaxial Airline Method |
|
|
184 | (2) |
|
5.2.4 Square Coaxial Airline |
|
|
186 | (2) |
|
|
188 | (3) |
|
5.4 Other Transmission Line Methods |
|
|
191 | (6) |
|
|
192 | (5) |
|
6 Scatter and Surface Waves |
|
|
197 | (42) |
|
|
197 | (23) |
|
|
200 | (2) |
|
6.1.2 Scattering Coefficient Measurement |
|
|
202 | (5) |
|
6.1.3 Examples of Scattering-Coefficient Measurement |
|
|
207 | (4) |
|
6.1.4 Echo-Width Measurement |
|
|
211 | (2) |
|
6.1.5 Examples of Echo-Width Measurement |
|
|
213 | (2) |
|
6.1.6 Cross-Polarized Scatter |
|
|
215 | (5) |
|
6.2 Near-Field Probe Measurements |
|
|
220 | (6) |
|
6.3 Surface-Traveling Wave |
|
|
226 | (13) |
|
6.3.1 Surface-Wave Attenuation |
|
|
227 | (2) |
|
6.3.2 Surface-Wave Attenuation Measurement |
|
|
229 | (5) |
|
6.3.3 Surface-Wave Backscatter |
|
|
234 | (2) |
|
|
236 | (3) |
|
|
239 | (32) |
|
|
239 | (3) |
|
7.2 CEM Inversion of Broadband Materials |
|
|
242 | (2) |
|
7.3 CEM Inversion Example: RF Capacitor |
|
|
244 | (13) |
|
7.3.1 RF Capacitor Design |
|
|
246 | (4) |
|
7.3.2 RF Capacitor Uncertainty |
|
|
250 | (2) |
|
7.3.3 Example Measurements |
|
|
252 | (5) |
|
7.4 CEM-Inversion Example: Nondestructive Measurement Probes |
|
|
257 | (7) |
|
7.4.1 Epsilon Measurement Probe |
|
|
258 | (3) |
|
7.4.2 Mu Measurement Probe |
|
|
261 | (3) |
|
7.5 CEM Inversion Example: Slotted Rectangular Coaxial Line |
|
|
264 | (7) |
|
|
269 | (2) |
|
8 Impedance Analysis and Related Methods |
|
|
271 | (34) |
|
|
271 | (1) |
|
8.2 Dielectric Spectroscopy |
|
|
271 | (13) |
|
8.2.1 Dielectric Parameters |
|
|
274 | (3) |
|
|
277 | (2) |
|
|
279 | (5) |
|
8.3 Dielectric Spectroscopy Applications |
|
|
284 | (10) |
|
|
286 | (4) |
|
8.3.2 Cure and Process Monitoring |
|
|
290 | (2) |
|
8.3.3 Film Formation and Environmental Effects |
|
|
292 | (1) |
|
8.3.4 High-Frequency Dielectric Analyses |
|
|
293 | (1) |
|
|
294 | (11) |
|
|
300 | (5) |
About the Author |
|
305 | (2) |
Index |
|
307 | |