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E-raamat: Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

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  • Formaat: PDF+DRM
  • Ilmumisaeg: 01-Jul-2016
  • Kirjastus: Springer International Publishing AG
  • Keel: eng
  • ISBN-13: 9783319398778
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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEMSuurem pilt
  • Formaat: PDF+DRM
  • Ilmumisaeg: 01-Jul-2016
  • Kirjastus: Springer International Publishing AG
  • Keel: eng
  • ISBN-13: 9783319398778
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This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth. Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes buthave only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.
1 An Introduction to Microscopy
1(26)
1.1 Limitations of the Human Eye
1(4)
1.2 The Light-Optical Microscope
5(3)
1.3 The X-ray Microscope
8(1)
1.4 The Transmission Electron Microscope
9(6)
1.5 The Scanning Electron Microscope
15(1)
1.6 Scanning Transmission Electron Microscope
16(3)
1.7 Analytical Electron Microscopy
19(1)
1.8 Low-Energy and Photoelectron Microscopes
19(1)
1.9 Field-Emission and Atom-Probe Microscopy
20(2)
1.10 Scanning-Probe Microscopes
22(3)
1.11 Further Reading
25(2)
2 Electron Optics
27(28)
2.1 Properties of an Ideal Image
27(2)
2.2 Imaging in Light Optics
29(3)
2.3 Imaging with Electrons
32(6)
2.4 Focusing Properties of a Thin Magnetic Lens
38(3)
2.5 Comparison of Magnetic and Electrostatic Lenses
41(1)
2.6 Defects of Electron Lenses
42(9)
2.7 Aberration Correctors and Monochromators
51(2)
2.8 Further Reading
53(2)
3 The Transmission Electron Microscope
55(34)
3.1 The Electron Gun
56(7)
3.1.1 Thermionic Emission
56(3)
3.1.2 Schottky Emission
59(1)
3.1.3 Field Emission
60(1)
3.1.4 Comparison of Electron Sources; Source Brightness
61(2)
3.2 Electron Acceleration
63(4)
3.3 Condenser-Lens System
67(4)
3.3.1 Condenser Aperture
69(1)
3.3.2 Condenser Stigmator
70(1)
3.3.3 Illumination Shift and Tilt Controls
71(1)
3.4 The Specimen Stage
71(3)
3.5 TEM Imaging System
74(9)
3.5.1 Objective Lens
74(1)
3.5.2 Objective Aperture
75(3)
3.5.3 Objective Stigmator
78(1)
3.5.4 Selected-Area Aperture
78(1)
3.5.5 Intermediate Lens
79(1)
3.5.6 Projector Lens
79(1)
3.5.7 TEM Screen and Camera System
80(1)
3.5.8 Depth of Focus and Depth of Field
81(2)
3.6 Scanning Transmission Systems
83(1)
3.7 Vacuum System
84(4)
3.8 Further Reading
88(1)
4 TEM Specimens and Images
89(32)
4.1 Kinematics of Scattering by an Atomic Nucleus
90(2)
4.2 Electron-Electron Scattering
92(1)
4.3 The Dynamics of Scattering
93(3)
4.4 Scattering Contrast from Amorphous Specimens
96(5)
4.5 Diffraction Contrast from Polycrystalline Specimens
101(2)
4.6 Dark-Field Images
103(1)
4.7 Electron-Diffraction Patterns
103(4)
4.8 Diffraction Contrast from a Single Crystal
107(3)
4.9 Phase Contrast in the TEM
110(4)
4.10 STEM Images
114(1)
4.11 TEM Specimen Preparation
115(4)
4.12 Further Reading
119(2)
5 The Scanning Electron Microscope
121(28)
5.1 Operating Principle of the SEM
121(3)
5.2 Penetration of Electrons into a Solid
124(2)
5.3 Secondary-Electron Images
126(5)
5.4 Backscattered-Electron Images
131(3)
5.5 Other SEM Imaging Modes
134(4)
5.6 SEM Operating Conditions
138(4)
5.7 SEM Specimen Preparation
142(1)
5.8 The Environmental SEM
143(2)
5.9 Electron-Beam Lithography
145(2)
5.10 Further Reading
147(2)
6 Analytical Electron Microscopy
149(22)
6.1 The Bohr Model of the Atom
149(3)
6.2 X-Ray Emission
152(3)
6.3 X-Ray Energy-Dispersive Spectroscopy
155(4)
6.4 Quantitative Analysis in the TEM
159(1)
6.5 Quantitative Analysis in the SEM
160(1)
6.6 X-Ray Wavelength-Dispersive Spectroscopy
161(2)
6.7 Comparison of XEDS and XWDS Analysis
163(1)
6.8 Auger-Electron Spectroscopy
164(1)
6.9 Electron Energy-Loss Spectroscopy
165(4)
6.10 Further Reading
169(2)
7 Special Topics
171(14)
7.1 Environmental TEM
171(2)
7.2 Radiation Damage
173(3)
7.3 Electron Tomography
176(1)
7.4 Electron Holography
177(4)
7.5 Time-Resolved Microscopy
181(3)
7.6 Further Reading
184(1)
Appendix: Mathematical Derivations 185(6)
Index 191
Ray Egerton is Professor Emeritus of Physics at the University of Alberta and at Portland State University. He serves as the Physical Sciences Editor for Micron, The International Research and Review Journal for Microscopy. Prof. Egerton has published 90 full papers in refereed journals and is the author of Electron Energy-Loss Spectroscopy in the Electron Microscope, (3rd Edition, 2011, Springer). His awards include the Presidential Science Award from the Microbeam Analysis Society, the Distinguished Scientist Award from the Microscopy Society of America, and the Frances Doane Award for service to the Microscopical Society of Canada. He is a fellow of the Royal Society of Canada.
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