(Ilmumisaeg: 01-Jan-2007, Hardback, Kirjastus: IEEE Computer Society Press, ISBN-13: 9780769528854)
saadame teile pakkumise kasutatud raamatule, mille hind võib erineda kodulehel olevast hinnast
A September 2007 symposium gathered academics, research scientists, and industrial practitioners in the global defect and fault tolerance (DFT) community to examine traditional DFT topics, such as error correction and fault tolerant designs, as well...Loe edasi...
(Ilmumisaeg: 31-Dec-2006, Hardback, Kirjastus: IEEE Computer Society Press, ISBN-13: 9780769528274)
Held in Freiburg, Germany in May, 2007, the 12th IEEE European Test Symposium (ETS 2007) drew researchers from around the world to discuss recent developments in the field of electronic-based circuit and system testing. This proceedings volume contai...Loe edasi...
(Ilmumisaeg: 31-Dec-2006, Paperback, Kirjastus: IEEE Computer Society Press, ISBN-13: 9780769528496)
These proceedings of the June 2007 conference include papers from academicians and practitioners with a special emphasis on systems engineering. The many papers here include such topics as embedded systems, including an assessment of the market by a...Loe edasi...
The 2006 conference organizers handled 1,131 papers and multiple reviews for each one; 54 were selected for oral presentation, and 264 for posters, all of which are presented in this two-volume proceedings set. The broad topics include recognition, s...Loe edasi...
Gathers the 12 papers presented during the January 2002 workshop on high performance computing, with an emphasis on low power design and network processing. Among the topics are reducing power with an L0 instruction cache using history-based predict...Loe edasi...
(Ilmumisaeg: 31-Jan-2006, Paperback, Kirjastus: IEEE Computer Society Press,U.S., ISBN-13: 9780769525488)
The first half of this volume consists of 15 papers from the November 2005 conference on qualities in architecture, requirements and design process, design decisions in architecting, software architecture consistency, and architectural descriptions....Loe edasi...
(Ilmumisaeg: 31-Jan-2006, Paperback, Kirjastus: IEEE Computer Society Press,U.S., ISBN-13: 9780769526010)
The proceedings of the June 2006 conference consists of 30 technical papers and eight tool demonstrations on the evolution of software systems, static and dynamic analysis, quality assessment, traceability and languages, and cognitive approaches. Top...Loe edasi...
(Ilmumisaeg: 31-Jan-2006, Paperback, Kirjastus: IEEE Computer Society Press,U.S., ISBN-13: 9780769526287)
These 63 papers selected for the November 2006 symposium explore techniques for testing integrated circuits and systems, and are divided into sessions on test power reduction, memory tests, design verification, scan test methods, defect diagnosis, an...Loe edasi...
(Ilmumisaeg: 31-Jan-2006, Paperback, Kirjastus: IEEE Computer Society Press,U.S., ISBN-13: 9780769526300)
Twenty-seven full papers and six shorts papers presented during the July 2006 symposium explore theoretical aspects and generalizations of Voronoi diagrams and Delaunay triangulations, and computational and implementation aspects of Voronoi methodolo...Loe edasi...
(Ilmumisaeg: 31-Jan-2006, Paperback, Kirjastus: IEEE Computer Society Press,U.S., ISBN-13: 9780769525938)
This collection contains papers from the proceedings of the 2006 International Symposium on a World of Wireless Mobile and Multimedia Networks, held in Buffalo-Niagra Falls, New York, in June of 2006. Fifty-nine papers from the technical sessions foc...Loe edasi...
The first set of three papers from the April 2006 workshop investigates distributed actuation attacks in wireless sensor networks, a framework for trust-based cluster head election, and a distributed approach to privacy for visual sensor networks. Th...Loe edasi...
(Ilmumisaeg: 31-Dec-2005, Paperback, Kirjastus: IEEE Computer Society Press, ISBN-13: 9780769525662)
Thirty-five papers from the May 2006 symposium present recent research on electronic-based circuit and system testing. Several of the papers explore memory testing, automatic test pattern generation, single-event upsets, diagnosis, reconfigurable sys...Loe edasi...
(Ilmumisaeg: 01-Jan-2005, Hardback, Kirjastus: IEEE Computer Society Press, ISBN-13: 9780769523415)
saadame teile pakkumise kasutatud raamatule, mille hind võib erineda kodulehel olevast hinnast
Thirty-five formal papers from the May 2005 symposium present trends, emerging results, and practical applications in the field of electronic-based circuit and system testing. The authors explore system-on-chip testing, fault and defect models, advan...Loe edasi...
saadame teile pakkumise kasutatud raamatule, mille hind võib erineda kodulehel olevast hinnast
Papers from an April 2004 symposium, originating in academia and industry, cover a range of topics in asynchronous circuits and systems, from formal verification to the design of a complex asynchronous system-on-chip. Design methodologies and automat...Loe edasi...
A collection of 69 posters presented at the June 2003 conference on improving undergraduate and graduate education in the design, implementation, and testing of microelectronic systems. Several of the posters explore system on chip design, mixed sig...Loe edasi...
