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The 60 full papers and 16 short ones were selected for the conference and the proceedings for their innovation and novelty of solution, as long as they were correct, coherent, and useful, of course. They cover test generation and fault simulation; so...Loe edasi...
Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are...Loe edasi...
(Ilmumisaeg: 01-Jan-2004, Hardback, Kirjastus: IEEE Computer Society Press, ISBN-13: 9780769522357)
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Seventy-four papers presented at the November 2004 symposium discuss advanced design for testability techniques for test cost reduction, system-on-a-chip test integration, and the diagnosis and repair of embedded digital, analog, and memory component...Loe edasi...
Held in Guam in November of 2002, the symposium on the test technologies and research issues related to silicon chip production, resulted in the 74 papers presented here. The papers are organized into sections related to the symposium sessions on tes...Loe edasi...
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Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, is a collection of design rules applied principally at the Integrated Circuit (IC) level that allow software to alleviate the growing cost of designing, producing and testing digital sy...Loe edasi...
Proceedings of the November 1995 conference, presenting research on electronics testing issues. Topics include systems test; analysis techniques; diagnosis; fault simulation; mixed-signal test; design for testability; education and research in testin...Loe edasi...
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Introduces diagnostic techniques that have been shown to reduce the overall lifetime cost of the product when used in the design phase of the development of a wide range of hardware components, including boards, memory, serial communications, seconda...Loe edasi...
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ITC is the premier technical conference on electronic testing. The theme of ITC 94, the 25th International Test Conference, was Test: The Next 25 Years. This conference introduced a new format that incorporates both leading-edge and mainstream subjec...Loe edasi...
Proceedings of the 2nd Asian Test Symposium held in Beijing, China, in November 1993. Among the topics: fault tolerance, analog and mixed circuit testing, and testability analysis. No index. Annotation copyright Book News, Inc. Portland, Or....Loe edasi...
