This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurat...Loe edasi...
This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurat...Loe edasi...
Stephen J. Gaul, Nicolaas van Vonno, Steven H. Voldman, Wesley H. Morris
(Ilmumisaeg: 03-Dec-2019, PDF+DRM, Kirjastus: John Wiley & Sons Inc, ISBN-13: 9781118701874)
A practical guide to the effects of radiation on semiconductor components of electronic systems, and techniques for the designing, laying out, and testing of hardened integrated circuits This book teaches the fundamentals of radiation environments an...Loe edasi...
Stephen J. Gaul, Nicolaas van Vonno, Steven H. Voldman, Wesley H. Morris
(Ilmumisaeg: 03-Dec-2019, EPUB+DRM, Kirjastus: John Wiley & Sons Inc, ISBN-13: 9781118701850)
A practical guide to the effects of radiation on semiconductor components of electronic systems, and techniques for the designing, laying out, and testing of hardened integrated circuits This book teaches the fundamentals of radiation environments an...Loe edasi...
(Ilmumisaeg: 19-Dec-2017, EPUB+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781351831550)
Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit des...Loe edasi...
(Ilmumisaeg: 19-Dec-2017, PDF+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781466590847)
Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit des...Loe edasi...
(Ilmumisaeg: 09-Feb-2015, PDF+DRM, Kirjastus: Springer International Publishing AG, ISBN-13: 9783319118420)
This book focuses on the design of a Mega-Gray (a standard unit of total ionizing radiation) radiation-tolerant ps-resolution time-to-digital converter (TDC) for a light detection and ranging (LIDAR) system used in a gamma-radiation environment. Seve...Loe edasi...
(Ilmumisaeg: 26-Nov-2014, PDF+DRM, Kirjastus: John Wiley & Sons Inc, ISBN-13: 9781118479315)
This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including...Loe edasi...
(Ilmumisaeg: 26-Nov-2014, EPUB+DRM, Kirjastus: John Wiley & Sons Inc, ISBN-13: 9781118479322)
This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including...Loe edasi...
Architecture Design for Soft Errors provides a comprehensive description of the architectural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective archi...Loe edasi...
(Ilmumisaeg: 24-Sep-2010, PDF+DRM, Kirjastus: Springer-Verlag New York Inc., ISBN-13: 9781441969934)
This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical...Loe edasi...
(Ilmumisaeg: 29-Jul-2004, PDF+DRM, Kirjastus: World Scientific Publishing Co Pte Ltd, ISBN-13: 9789814482158)
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft...Loe edasi...
