This book explores the synergy between VLSI and Machine Learning and its applications across various domains. It will investigate how Machine Learning techniques can enhance the design and testing of VLSI circuits, improve power efficiency, optimi...Loe edasi...
This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research.The b...Loe edasi...
This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implemen...Loe edasi...
This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The...Loe edasi...
The Complete, Modern Tutorial on Practical VLSI Chip Design, Validation, and Analysis As microelectronics engineers design complex chips using existing circuit libraries, they must ensure correct logical, physical, and electrical prop...Loe edasi...
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system levelDescribes rang...Loe edasi...
Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can...Loe edasi...
The book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. The book will be suitable for the researchers working on power- and thermal...Loe edasi...
The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level de...Loe edasi...
(Ilmumisaeg: 30-Apr-2016, Hardback, Kirjastus: Artech House Publishers, ISBN-13: 9781608079858)
Providing a complete introduction to the state of the art in high-speed digital testing with automated test equipment (ATE), this practical resource is the first book to focus exclusively on this increasingly important topic. Featuring clear examples...Loe edasi...
As part of a two-book series devoted to Electronic Design Automation for Integrated Circuits, this first installment examines logical design, focusing on system-level and micro-architectural design, verification and testing. It begins with a gener...Loe edasi...
Silicon, as a single-crystal semiconductor, has sparked a revolution in the field of electronics and touched nearly every field of science and technology. Though available abundantly as silica and in various other forms in nature, silicon is diffi...Loe edasi...
(Ilmumisaeg: 20-Nov-2013, Paperback / softback, Kirjastus: William Andrew Publishing, ISBN-13: 9780323241434)
New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists...Loe edasi...
Manoj Singh Gaur, Mark Zwolinski, Vijay Laxmi, D. Boolchandani, Virendra Sing, Adit Singh
Sari: Communications in Computer and Information Science
(Ilmumisaeg: 10-Dec-2013, Paperback / softback, Kirjastus: Springer-Verlag Berlin and Heidelberg GmbH & Co. K, ISBN-13: 9783642420238)
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers...Loe edasi...
Covering new and promising techniques for cost-effectively testing high-speed interfaces with high test coverage, the authors focus on efficient test methodologies for jitter and bit-error-rate, widely used for assessing the quality of communicati...Loe edasi...
(Ilmumisaeg: 31-Jan-2012, Hardback, Kirjastus: Springer-Verlag New York Inc., ISBN-13: 9781441999757)
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework....Loe edasi...
(Ilmumisaeg: 02-Jul-2012, Paperback / softback, Kirjastus: Springer-Verlag Berlin and Heidelberg GmbH & Co. K, ISBN-13: 9783642314933)
This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012.The 30 revised regular papers presented together with 10 short papers and 13 poster sessions w...Loe edasi...
(Ilmumisaeg: 07-Dec-2010, Paperback / softback, Kirjastus: Springer-Verlag New York Inc., ISBN-13: 9781441954220)
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwin...Loe edasi...
(Ilmumisaeg: 28-Feb-2010, Hardback, Kirjastus: Artech House Publishers, ISBN-13: 9781596939899)
This analysis of methods for subjecting integrated circuits and semiconductor devices to electrical testing and stress testing will serve as a tutorial for engineers working with automatic test equipment. It shows how wafer-level testing during burn-...Loe edasi...
Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are...Loe edasi...
