The text discusses designing electronic, electrical and communication circuits using the software and observing the output behavior for different parametric values. It will be a useful text for undergraduate, graduate students, and academic researche...Loe edasi...
The text discusses designing electronic, electrical and communication circuits using the software and observing the output behavior for different parametric values. It will be a useful text for undergraduate, graduate students, and academic researche...Loe edasi...
This textbook provides a compact but comprehensive treatment that guides students through the analysis of circuits, using LTspice®. Ideal as a hands-on source for courses in Circuits, Electronics, Digital Logic and Power Electronics this t...Loe edasi...
(Ilmumisaeg: 27-Aug-2022, Hardback, Kirjastus: Springer International Publishing AG, ISBN-13: 9783031098529)
This textbook provides a compact but comprehensive treatment that guides students through the analysis of circuits, using LTspice®. Ideal as a hands-on source for courses in Circuits, Electronics, Digital Logic and Power Electronics this t...Loe edasi...
The text discusses designing electronic, electrical and communication circuits using the software and observing the output behavior for different parametric values. It will be a useful text for undergraduate, graduate students, and academic researche...Loe edasi...
(Ilmumisaeg: 02-Dec-2016, Hardback, Kirjastus: John Wiley & Sons Inc, ISBN-13: 9780470511916)
Presenting information on electrostatic discharge (ESD) and the characterization of semiconductor devices, this book examines ESD physical models and discusses the test systems and testing and specifications of each model, including the RF ESD test s...Loe edasi...
This book introduces novel developments in the field of electromagnetic non-destructive testing and evaluation (NDT/E). The topics include electromagnetic ultrasonic guided wave testing, pulsed eddy current testing, remote field eddy current...Loe edasi...
saadame teile pakkumise kasutatud raamatule, mille hind võib erineda kodulehel olevast hinnast
The 60 full papers and 16 short ones were selected for the conference and the proceedings for their innovation and novelty of solution, as long as they were correct, coherent, and useful, of course. They cover test generation and fault simulation; so...Loe edasi...
Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are...Loe edasi...
saadame teile pakkumise kasutatud raamatule, mille hind võib erineda kodulehel olevast hinnast
Introduction to MultiSIM, 1e, is a workbook that combines fundamental theory of dc and ac electronics with practical circuit analysis and simulation with MultiSIM. Featuring MultiSIM v. 9 and 10, it organizes material into forty manageable sec...Loe edasi...
saadame teile pakkumise kasutatud raamatule, mille hind võib erineda kodulehel olevast hinnast
Now updated to MultiSIM 9, this workbook supplements basic DC/AC instruction and demonstrates how to troubleshoot faulty circuits using MultiSIM as the standard tool. Working on the computer, readers will learn to make measurements, determine faults,...Loe edasi...
(Ilmumisaeg: 23-Jan-2006, Hardback, Kirjastus: Springer-Verlag New York Inc., ISBN-13: 9780387294087)
This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development...Loe edasi...
Intended for hardware design engineers, this book introduces general verification techniques, compares them with formal verification techniques, and provides instructions for creating formal high level requirement. The authors discuss formal verifica...Loe edasi...
(Ilmumisaeg: 01-Jan-2005, Hardback, Kirjastus: Institute of Electrical & Electronics Engineers(IEEE), ISBN-13: 9780769524061)
saadame teile pakkumise kasutatud raamatule, mille hind võib erineda kodulehel olevast hinnast
In these proceedings from the July 2005 conference, participants face the challenges of new nanotechnologies and their associated field failures, new questions about data and installation security, and the ever-shrinking time to market. General topic...Loe edasi...
(Ilmumisaeg: 01-Jan-2004, Hardback, Kirjastus: Institute of Electrical & Electronics Engineers(IEEE), ISBN-13: 9780769521800)
saadame teile pakkumise kasutatud raamatule, mille hind võib erineda kodulehel olevast hinnast
The proceedings of the July 2004 symposium include papers on timing and transient faults, self-testing and self-checking circuits, checker and voter design, concurrent error detection, microprocessor on-line testing and evaluation, error-correcting c...Loe edasi...
(Ilmumisaeg: 01-Jan-2004, Hardback, Kirjastus: IEEE Computer Society Press, ISBN-13: 9780769522357)
saadame teile pakkumise kasutatud raamatule, mille hind võib erineda kodulehel olevast hinnast
Seventy-four papers presented at the November 2004 symposium discuss advanced design for testability techniques for test cost reduction, system-on-a-chip test integration, and the diagnosis and repair of embedded digital, analog, and memory component...Loe edasi...
Held in Guam in November of 2002, the symposium on the test technologies and research issues related to silicon chip production, resulted in the 74 papers presented here. The papers are organized into sections related to the symposium sessions on tes...Loe edasi...
