With the end of Dennard scaling and Moores law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chi...Loe edasi...
With the end of Dennard scaling and Moores law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chi...Loe edasi...
(Ilmumisaeg: 16-Nov-2022, PDF+DRM, Kirjastus: Springer International Publishing AG, ISBN-13: 9783031153457)
This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital s...Loe edasi...
(Ilmumisaeg: 16-Nov-2022, EPUB+DRM, Kirjastus: Springer International Publishing AG, ISBN-13: 9783031153457)
This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital s...Loe edasi...
A complete guide to MEMS engineering, fabrication, and applicationsThis comprehensive engineering guide shows, step by step, how to incorporate cutting-edge microelectromechanical (MEMS) technology to enable internet-of-things (IoT) and artificial in...Loe edasi...
A complete guide to MEMS engineering, fabrication, and applicationsThis comprehensive engineering guide shows, step by step, how to incorporate cutting-edge microelectromechanical (MEMS) technology to enable internet-of-things (IoT) and artificial in...Loe edasi...
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the ri...Loe edasi...
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the ri...Loe edasi...
(Ilmumisaeg: 03-Oct-2018, EPUB+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781351990493)
Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of erro...Loe edasi...
(Ilmumisaeg: 03-Oct-2018, PDF+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781466503472)
Currently strain engineering is the main technique used to enhance the performance of advanced silicon-based metal-oxide-semiconductor field-effect transistors (MOSFETs). Written from an engineering application standpoint, Strain-Engineered MOSFETs i...Loe edasi...
(Ilmumisaeg: 03-Oct-2018, PDF+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781482277715)
Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of erro...Loe edasi...
(Ilmumisaeg: 22-Nov-2017, EPUB+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781351443562)
Achieving cost-effective performance over time requires an organized, disciplined, and time-phased approach to product design, development, qualification, manufacture, and in-service management. Guidebook for Managing Silicon Chip Reliability exam...Loe edasi...
(Ilmumisaeg: 22-Nov-2017, PDF+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781351443579)
Achieving cost-effective performance over time requires an organized, disciplined, and time-phased approach to product design, development, qualification, manufacture, and in-service management. Guidebook for Managing Silicon Chip Reliability exam...Loe edasi...
(Ilmumisaeg: 05-Oct-2017, PDF+DRM, Kirjastus: Springer International Publishing AG, ISBN-13: 9783319666198)
Until now, there has been a lack of a complete knowledge base to fully comprehend Low power (LP) design and power aware (PA) verification techniques and methodologies and deploy them all together in a real design verification and implementation proje...Loe edasi...
(Ilmumisaeg: 05-Oct-2017, EPUB+DRM, Kirjastus: Springer International Publishing AG, ISBN-13: 9783319666198)
Until now, there has been a lack of a complete knowledge base to fully comprehend Low power (LP) design and power aware (PA) verification techniques and methodologies and deploy them all together in a real design verification and implementation proje...Loe edasi...
Sustainable Wireless Network-on-Chip Architectures focuses on developing novel Dynamic Thermal Management (DTM) and Dynamic Voltage and Frequency Scaling (DVFS) algorithms that exploit the advantages inherent in WiNoC architectures. The methodologies...Loe edasi...
Sustainable Wireless Network-on-Chip Architectures focuses on developing novel Dynamic Thermal Management (DTM) and Dynamic Voltage and Frequency Scaling (DVFS) algorithms that exploit the advantages inherent in WiNoC architectures. The methodologies...Loe edasi...
(Ilmumisaeg: 26-Nov-2014, PDF+DRM, Kirjastus: John Wiley & Sons Inc, ISBN-13: 9781118479315)
This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including...Loe edasi...
(Ilmumisaeg: 26-Nov-2014, EPUB+DRM, Kirjastus: John Wiley & Sons Inc, ISBN-13: 9781118479322)
This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including...Loe edasi...
(Ilmumisaeg: 08-Nov-2014, PDF+DRM, Kirjastus: Springer-Verlag New York Inc., ISBN-13: 9781461440789)
This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques...Loe edasi...
