(Ilmumisaeg: 25-Nov-2020, EPUB+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781000146011)
"e;Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains se...Loe edasi...
(Ilmumisaeg: 25-Nov-2020, PDF+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781000110166)
"e;Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains se...Loe edasi...
Suman Lata Tripathi, Sobhit Saxena, Sushanta Kumar Mohapatra
(Ilmumisaeg: 18-Aug-2020, EPUB+DRM, Kirjastus: Taylor & Francis Ltd, ISBN-13: 9781000168174)
This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The deep understanding of basic co...Loe edasi...
Suman Lata Tripathi, Sobhit Saxena, Sushanta Kumar Mohapatra
(Ilmumisaeg: 18-Aug-2020, PDF+DRM, Kirjastus: Taylor & Francis Ltd, ISBN-13: 9781000168150)
This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The deep understanding of basic co...Loe edasi...
The Complete, Modern Tutorial on Practical VLSI Chip Design, Validation, and Analysis As microelectronics engineers design complex chips using existing circuit libraries, they must ensure correct logical, physical, and electrical properties, and pre...Loe edasi...
(Ilmumisaeg: 03-Oct-2018, EPUB+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781351838009)
A current trend in digital design-the integration of the MATLAB(R) components Simulink(R) and Stateflow(R) for model building, simulations, system testing, and fault detection-allows for better control over the design flow process and, ultimately, fo...Loe edasi...
(Ilmumisaeg: 03-Oct-2018, PDF+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781420004595)
A current trend in digital design-the integration of the MATLAB(R) components Simulink(R) and Stateflow(R) for model building, simulations, system testing, and fault detection-allows for better control over the design flow process and, ultimately, fo...Loe edasi...
(Ilmumisaeg: 24-Apr-2018, PDF+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781351227773)
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system levelDescribes range of algorithms for addressing thermal-aware test issue, presents...Loe edasi...
(Ilmumisaeg: 24-Apr-2018, EPUB+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781351227766)
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system levelDescribes range of algorithms for addressing thermal-aware test issue, presents...Loe edasi...
(Ilmumisaeg: 31-Jan-2016, PDF+DRM, Kirjastus: Artech House Publishers, ISBN-13: 9781608079865)
This second edition of An Engineers Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this on...Loe edasi...
(Ilmumisaeg: 08-Dec-2014, EPUB+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781040055854)
Silicon, as a single-crystal semiconductor, has sparked a revolution in the field of electronics and touched nearly every field of science and technology. Though available abundantly as silica and in various other forms in nature, silicon is difficul...Loe edasi...
(Ilmumisaeg: 08-Dec-2014, PDF+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781482232820)
Silicon, as a single-crystal semiconductor, has sparked a revolution in the field of electronics and touched nearly every field of science and technology. Though available abundantly as silica and in various other forms in nature, silicon is difficul...Loe edasi...
Manoj Singh Gaur, Mark Zwolinski, Vijay Laxmi, D. Boolchandani, Virendra Sing, Adit Singh
Sari: Communications in Computer and Information Science
(Ilmumisaeg: 13-Dec-2013, PDF+DRM, Kirjastus: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, ISBN-13: 9783642420245)
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers...Loe edasi...
(Ilmumisaeg: 13-Nov-2013, PDF+DRM, Kirjastus: William Andrew Publishing, ISBN-13: 9780128000175)
New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressi...Loe edasi...
(Ilmumisaeg: 13-Nov-2013, EPUB+DRM, Kirjastus: William Andrew Publishing, ISBN-13: 9780128000175)
New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressi...Loe edasi...
Der Test stellt einen wichtigen Schritt im Entwurfs-und Herstellungsablauf digitaler Schal tungen dar, indem er unter Anwendung bestimmter Eingangssignale die Funktion einer ent worfenen Schaltung an einem hergestellten Exemplar zu verifizieren e...Loe edasi...
Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing meth...Loe edasi...
Sari: Theoretical Computer Science and General Issues
(Ilmumisaeg: 26-Jun-2012, PDF+DRM, Kirjastus: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, ISBN-13: 9783642314940)
This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster session...Loe edasi...
(Ilmumisaeg: 23-Sep-2011, PDF+DRM, Kirjastus: Institution of Engineering and Technology, ISBN-13: 9780863419997)
Systems on Chip (SoC) for communications, multimedia and computer applications have recently received much international attention; one such example being the single-chip transceiver. Modern microelectronic design adopts a mixed-signal approach as a...Loe edasi...
(Ilmumisaeg: 20-Sep-2011, EPUB+DRM, Kirjastus: John Wiley & Sons Inc, ISBN-13: 9781118210314)
The only source for practical, real-world information on RF measurements for cellular phones and wireless data systems It is predicted that by the year 2010, all digital wireless communications equipment including cellular, PCS, and 3G phones; wirel...Loe edasi...
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-c...Loe edasi...
This book will explain how to verify SoC (Systems on Chip) logic designs using "e;formal and "e;semiformal verification techniques. The critical issue to be addressed is whether the functionality of the design is the one that the designers in...Loe edasi...
(Ilmumisaeg: 23-Feb-2010, PDF+DRM, Kirjastus: Springer-Verlag New York Inc., ISBN-13: 9780387235219)
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital,...Loe edasi...
(Ilmumisaeg: 31-Jan-2010, PDF+DRM, Kirjastus: Artech House Publishers, ISBN-13: 9781596939905)
Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer form. Burn-in is a temperature/bias reliability stress test used in detecting and screeni...Loe edasi...
Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High...Loe edasi...
Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are i...Loe edasi...
(Ilmumisaeg: 01-Jul-2009, PDF+DRM, Kirjastus: John Wiley & Sons Inc, ISBN-13: 9780470747261)
Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and cas...Loe edasi...
(Ilmumisaeg: 19-Nov-2008, EPUB+DRM, Kirjastus: Taylor & Francis Inc, ISBN-13: 9781040078501)
Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the in...Loe edasi...
